This shows you the differences between two versions of the page.
Both sides previous revision Previous revision Next revision | Previous revision Next revision Both sides next revision | ||
courses:ee6361_2019:start [2019/04/05 06:23] janakiraman |
courses:ee6361_2019:start [2019/04/22 10:34] janakiraman |
||
---|---|---|---|
Line 113: | Line 113: | ||
[[http://www.ee.iitm.ac.in/~janakiraman/courses/EE6361/Jan-2018/material/EE6361-eDRAM-Janakiraman-2018.pdf|eDRAM Lecture Slides (2018)]] | [[http://www.ee.iitm.ac.in/~janakiraman/courses/EE6361/Jan-2018/material/EE6361-eDRAM-Janakiraman-2018.pdf|eDRAM Lecture Slides (2018)]] | ||
- | ===== Class 10 (22 Mar 2018) ===== | + | ===== Class 10 (22 Mar 2019) ===== |
* Write time calculation | * Write time calculation | ||
* Hierarchical sensing | * Hierarchical sensing | ||
Line 130: | Line 130: | ||
- M. Kang, S. K. Gonugondla, A. Patil and N. R. Shanbhag, "A Multi-Functional In-Memory Inference Processor Using a Standard 6T SRAM Array," in IEEE Journal of Solid-State Circuits, vol. 53, no. 2, pp. 642-655, Feb. 2018. doi: 10.1109/JSSC.2017.2782087 | - M. Kang, S. K. Gonugondla, A. Patil and N. R. Shanbhag, "A Multi-Functional In-Memory Inference Processor Using a Standard 6T SRAM Array," in IEEE Journal of Solid-State Circuits, vol. 53, no. 2, pp. 642-655, Feb. 2018. doi: 10.1109/JSSC.2017.2782087 | ||
- | ===== Class 11 (22 Mar 2018) ===== | + | ===== Class 11 (29 Mar 2019) ===== |
* Read time calculation | * Read time calculation | ||
* SOI Technology - Floating body effects on eDRAM | * SOI Technology - Floating body effects on eDRAM | ||
Line 139: | Line 139: | ||
[[https://forms.gle/8de7B43mobrrEb7A9|In class quiz]] | [[https://forms.gle/8de7B43mobrrEb7A9|In class quiz]] | ||
+ | |||
+ | |||
+ | ===== Class 12 (5 Apr 2019) ===== | ||
+ | * Variability study | ||
+ | * Thick Oxide Word-line drivers | ||
+ | * Thin Oxide Word-line drivers | ||
+ | [[https://forms.gle/9Y1RgQBuT4qiugpH7|In class quiz]] | ||
+ | |||
+ | |||
+ | ===== Class 13 (12 Apr 2019) ===== | ||
+ | * Redundancy and Testing | ||
+ | * Non Volatile Memories | ||
+ | * Charge Trap Transistor | ||
+ | |||
+ | [[https://forms.gle/7NgWNBcYsndjrwSy6|In class quiz]] | ||