INTEGRATED OPTOELECTRONICS RESEARCH GROUP

Department of Electrical Engineering, IIT Madras, Chennai-600036, India

Characterization Facilities

Microscope

Confocal microscope

Surface Profiler

Ellipsometer

Electronic Probe Station

High Resolution OSA

Optical Characterization - 1

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Optical Characterization - 2

Optical Characterization - 3

Optical Characterization - 4

 IEEE Journal of  Selected Topics in Quantum Electronics, Vol. 23, NO. 2, March /April 2017. DOI: 10.1109/JSTQE.2016.2596259

 

    









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