Centre for Nanoelectromechanical Systems (NEMS) and Nanophotonics (CNNP)

Electrical Characterization Sample description for Four probe kit.jpg

Electrical Characterization Sample description for Parametric Analyser - B1505.jpg

Electrical Characterization Sample description for Parametric Analyser - Keithley (For cryo probe station) - Copy.jpg

Electrical Characterization Sample description for Parametric Analyser - Keithley (For cryo probe station).jpg

Electrical Characterization Sample description for Probe station - Cryo.jpg

Electrical Characterization Sample description for Probe station - Manual.jpg

Electrical Characterization Sample description for Probe station - Thermal.jpg

Electrical Characterization Sample description for Probe station - Vacuum.jpg

Electrical Characterization Sample description for Probe station 1.jpg

Electrical Characterization Sample description for Solar cell Tester.jpg

Optical Characterization Sample description for 3D Non contact optical profilometer- Bruker contour GT.jpg

Optical Characterization Sample description for Confocal Microscope - Olympus.jpg

Optical Characterization Sample description for Nikkon Microscope.jpg

Optical Characterization Sample description for Spectroscopic Ellipsometer.jpg

Optical Characterization Sample description for Table top SEM SNE 4500M.jpg

Characterization Tools