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Simultaneous Detection of Defect and Lift-off Using a Modified Pulsed Eddy Current Probe

June 20 @ 4:00 pm - 5:00 pm

DATE     :         20-June-2019

TIME     :         4 PM

VENUE  :         ESB 244

SPEAKER:     S Sreevatsan (EE16S062)

Guide: Dr. Boby George

 

Abstract

Lift-off variance is a major limiting factor in eddy current based defect detection probes. Pulsed eddy current (PEC) technique has been found to be advantageous in catering to the lift-off variance problem. By using the lift-off invariant point (LOI) in the PEC technique, the measurements can be made immune to lift-off distance variations. The LOI has a limit on the maximum lift-off distance range, and if the lift-off is beyond this range, the output will be erroneous. Hence it is important to sense the lift-off and ensure that it is within the range. In this seminar, a new and efficient lift-off detection technique, which is simultaneously operated along with the PEC technique, will be presented. The new scheme requires no change in the sensing element in the probe, the measurement mechanism alone is modified to achieve this feature. The lift-off distance is determined by measuring the leakage current between the probe and the target. The technique developed for simultaneous detection of defects and lift-off distance was modeled, simulated, tested and experimentally validated using a prototype developed. The lift-off detection technique was found to be insensitive to the typical defects of the target and sensitive only to the lift-off. This technique requires very minimal additional hardware and no change to the probe. The proposed approach helps to achieve reliable defect detection using the PEC probe. The design details and experimental results will be discussed in the talk.

ALL ARE CORDIALLY INVITED

Details

Date:
June 20
Time:
4:00 pm - 5:00 pm
Event Category:

Venue

ESB – 244
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